9 results
Structural and Optical Properties of the Multilayer Structures Formed by Ge Sub-Critical Insertions in a Si Matrix
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 717 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, C4.4
- Print publication:
- 2002
-
- Article
- Export citation
Thermomechanical stress in silicon on quartz wafer bonding and Smart Cut® process
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 681 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I5.10
- Print publication:
- 2001
-
- Article
- Export citation
Fermi-Level Effect and Junction Carrier Concentration Effect on Boron Distribution in GexSil−x/Si Heterostructures
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 535 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 275
- Print publication:
- 1998
-
- Article
- Export citation
Fermi-Level effect and junction carrier concentration effect on p-Type dopant distribution in IlI-V Compound superlattices
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 535 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 219
- Print publication:
- 1998
-
- Article
- Export citation
Gold Diffusion in Silicon During Gettering by an Aluminum Layer
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 490 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 117
- Print publication:
- 1997
-
- Article
- Export citation
Thermal Equilibrium Concentrations and Effects of Ga Vacancies in n-TYPE GaAs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 300 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 377
- Print publication:
- 1993
-
- Article
- Export citation
Crystal Surface Stoichiometry and the Fermi Level Effects on Outdiffusion of Si in GaAs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 282 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 151
- Print publication:
- 1992
-
- Article
- Export citation
Point Defects and Diffusion in Semiconductors
-
- Journal:
- MRS Bulletin / Volume 16 / Issue 11 / November 1991
- Published online by Cambridge University Press:
- 29 November 2013, pp. 42-46
- Print publication:
- November 1991
-
- Article
- Export citation
An Examination of the Mechanisms of Si Diffusion in GaAs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 163 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 671
- Print publication:
- 1989
-
- Article
- Export citation